K. G. Frigillana, J. C. Jocson, R. M. C. Muldong, L. O. Natividad, and H. T. Tiongson, “The Effects of Reimplementing a Biometric Attendance Monitoring System in the Electronics Engineering Department at Don Honorio Ventura State University”, etj, vol. 8, no. 12, pp. 3138–3142, Dec. 2023.