SULE, Mohammed Adamu; D, Denis Jonathan; NJODI, Bashir I.; SAIDU, K.A .; ABDULKADIR, Maryam . Effects of Scaling of Junctionless Transistor Parameters with Silicon Dioxide (Sio2) and Silicon Nitrate (Si3N4) Gate Oxides on the Electrical Characteristics of the Devices. Engineering And Technology Journal, [S. l.], v. 8, n. 7, p. 2458–2461, 2023. DOI: 10.47191/etj/v8i7.12. Disponível em: https://everant.org/index.php/etj/article/view/972. Acesso em: 21 nov. 2024.