GIANG, Tran Thi Huyen; BICH, Do Ngoc; LIEN, Vu Thi Kim. Calculation of the Second EXAFS Cumulant of Si Using the Anharmonic Correlated Einstein Model. Engineering And Technology Journal, [S. l.], v. 9, n. 8, p. 4648–4651, 2024. DOI: 10.47191/etj/v9i08.04. Disponível em: https://everant.org/index.php/etj/article/view/1397. Acesso em: 21 nov. 2024.