FRIGILLANA, Katherine G.; JOCSON, Joefil C.; MULDONG, Roviel Manfre C.; NATIVIDAD, Lester O.; TIONGSON, Hazel T. The Effects of Reimplementing a Biometric Attendance Monitoring System in the Electronics Engineering Department at Don Honorio Ventura State University. Engineering And Technology Journal, [S. l.], v. 8, n. 12, p. 3138–3142, 2023. DOI: 10.47191/etj/v8i12.03. Disponível em: https://everant.org/index.php/etj/article/view/1100. Acesso em: 21 nov. 2024.