Demodulation of Interferogram with Closed Fringes Using the Phase Shifting Technique
Downloads
This research exposes the foundations of optical metrology which occupies one of the most important in optics. A brief description is made of interferometry which in turn is part of the optical metrology. It demonstrates how an interferogram is obtained. It is also explained the way in which one of the most advanced techniques is applied simple in the demodulation of the phase, since the goal of any technique in interferometry is to find the term “phase” which refers to the physical quantity to be measured whether effort, displacement, distance, pressure, temperature, velocity, shape, dimensions, etc; since it is not possible to achieve it by the conventional methods. The phase obtained in the present article corresponds to the image (interferogram) of a pattern of closed fringes of a lens, which uses a technique called phase shift that consists of acquiring several interferograms, which in turn lead to a result known as phase wrapped so it is necessary to apply some method phase unwrapping to obtain the solution.
Hariharan, P. (1996). Basic of Interferometry. Academic Press: New York.
Goodman, J.W. (1996). Introduction of Fourier Optics. Mc. Graw-Hill: Singapore
Mitsuo Takeda, Hideki Ina, and Seiji Kobayashi, (1982). “Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry”, Journal of the Optical Society of America, Vol. 72, Issue 1, pp. 156-160.
Servin, M., Marroquin, J.L. Cuevas, F. (2001). “Fringe-follower regularized phase tracker for demodulation of closed-fringe interferograms”, Journal of the Optical Society of America, 18(3):689-695
Rodriguez-Vera, R Servin M., (1993). “Two dimensional phase locked loop demodulation of interferograms”. J. Mod. Opt. 40(11), 2087-2094
Sulaiman M., Salhi A., Selamoglu B.I., and Kirikchi O.B., (2014). “A Plant Propagation Algorithm for Constrained Engineering Optimization Problems”, Mathematical Problems in Engineering (1), Article ID 627416, 10 pages
Malacara, D., Servin, M., Malacara, Z., (2005). Interferogram Analysis for Optical Testing, 2nd ed., Taylor & Francis, Boca Raton.
Gåsvik K.J. (2002). Optical Metrology, 3rd ed., John Wiley & Sons, LTD, Sussex.
Malacara, D., Servin, M., Malacara, Z., (2005). Interferogram Analysis for Optical Testing, 2nd ed., Taylor & Francis: Boca Raton.
Ghiglia D., Pritt M., (1998). Two-Dimensional Phase Unwrapping Theory, Algorithms and Applications, John Wiley & Sons: USA (1998).
